发明名称 THREE-AXIS ELECTRON MICROSCOPE HOLDER WITH A SIMPLE STRUCTURE
摘要 The present invention relates to a holder with a simple structure that can substitute for an existing sample stage in an electron microscope and, more specifically, to an electron microscope holder comprising: (A) a sample mounting part that includes a sample cradle having a beam transmission hole formed in the center thereof and a support plate on which the sample cradle is seated; (B) a base part having an opening in which the sample mounting part is accommodated with a predetermined clearance therebetween; and (C) two or more sets of drive parts, each of which includes: a pair of rotary mounts coupled to the base part and the support plate to horizontally rotate, respectively; a driver fixedly coupled to one of the rotary mounts; and a drive rod that is coupled to the driver so as to horizontally move and performs a linear motion by the operation of the driver, one distal end of the drive rod being fixedly coupled to the other of the rotary mounts.
申请公布号 WO2016052776(A1) 申请公布日期 2016.04.07
申请号 WO2014KR09146 申请日期 2014.09.30
申请人 KOREA BASIC SCIENCE INSTITUTE 发明人 JEUNG, JONG-MAN;KIM, YOUN-JOONG;KIM, JIN-GYU;KIM, JONG GU
分类号 H01J37/20;H01J37/26 主分类号 H01J37/20
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