发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE |
摘要 |
A method for manufacturing a semiconductor substrate. An impurity diffusion ingredient can be diffused well and uniformly from a coating film into a semiconductor substrate by forming a coating film having a thickness of not more than 30 nm on a surface of a semiconductor substrate with a diffusion agent composition containing an impurity diffusion ingredient and a silicon compound that can be hydrolyzed to produce a silanol group. |
申请公布号 |
US2016099149(A1) |
申请公布日期 |
2016.04.07 |
申请号 |
US201514872714 |
申请日期 |
2015.10.01 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
SAWADA Yoshihiro |
分类号 |
H01L21/225;H01L21/02 |
主分类号 |
H01L21/225 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a semiconductor substrate into which an impurity diffusion ingredient is diffused, the method comprising:
forming a coating film having a thickness of not more than 30 nm by coating a diffusion agent composition onto a semiconductor substrate; and diffusing the impurity diffusion ingredient contained in the diffusion agent composition into the semiconductor substrate, wherein the diffusion agent composition comprises the impurity diffusion ingredient and a silicon compound, wherein the silicon compound can be hydrolyzed to produce a silanol group. |
地址 |
Kawasaki-shi JP |