发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE
摘要 A method for manufacturing a semiconductor substrate. An impurity diffusion ingredient can be diffused well and uniformly from a coating film into a semiconductor substrate by forming a coating film having a thickness of not more than 30 nm on a surface of a semiconductor substrate with a diffusion agent composition containing an impurity diffusion ingredient and a silicon compound that can be hydrolyzed to produce a silanol group.
申请公布号 US2016099149(A1) 申请公布日期 2016.04.07
申请号 US201514872714 申请日期 2015.10.01
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 SAWADA Yoshihiro
分类号 H01L21/225;H01L21/02 主分类号 H01L21/225
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor substrate into which an impurity diffusion ingredient is diffused, the method comprising: forming a coating film having a thickness of not more than 30 nm by coating a diffusion agent composition onto a semiconductor substrate; and diffusing the impurity diffusion ingredient contained in the diffusion agent composition into the semiconductor substrate, wherein the diffusion agent composition comprises the impurity diffusion ingredient and a silicon compound, wherein the silicon compound can be hydrolyzed to produce a silanol group.
地址 Kawasaki-shi JP