发明名称 A PROCESS FOR THE MANUFACTURE OF SEMICONDUCTOR DEVICES COMPRISING THE CHEMICAL MECHANICAL POLISHING (CMP) OF III-V MATERIAL IN THE PRESENCE OF A CMP COMPOSITION COMPRISING A SPECIFIC NON-IONIC SURFACTANT
摘要 A process for the manufacture of semiconductor devices comprising the chemical-mechanical polishing of a substrate or layer containing at least one III-V material in the presence of a chemical-mechanical polishing composition (Q1) comprising (A) inorganic particles, organic particles, or a mixture or composite thereof, (B) at least one amphiphilic non-ionic surfactant having (b1) at least one hydrophobic group; and (b2) at least one hydrophilic group selected from the group consisting of polyoxyalkylene groups comprising (b22) oxyalkylene monomer units other than oxyethylene monomer units; and (M) an aqueous medium.
申请公布号 EP2852644(A4) 申请公布日期 2016.04.06
申请号 EP20130794728 申请日期 2013.05.21
申请人 BASF SE 发明人 NOLLER, BASTIAN MARTEN;GILLOT, CHRISTOPHE;FRANZ, DIANA;LI, YUZHUO
分类号 H01L21/306;C09G1/02 主分类号 H01L21/306
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