发明名称 遅延解析プログラム,遅延解析装置および遅延解析方法
摘要 <P>PROBLEM TO BE SOLVED: To highly accurately estimate a failure factor. <P>SOLUTION: A selection section 12 selects one of a plurality of activated paths as an analysis object path as for elements reached by the plurality of activated paths among a plurality of elements. A first calculation section 13 calculates the delay distribution of the analysis object path under conditions that the analysis object path is the slowest among the plurality of activated paths on the basis of the delay distribution of each of the plurality of activated paths obtained in a design stage. A second calculation section 14 calculates a value indicating the degree of influence given to the delay by random variation in the plurality of activate paths on the basis of the delay distribution calculated by the first calculation section 13. An analysis section 15 performs delay analysis including the value indicating the degree of influence calculated by the second calculation section 14 as one of delay factors relating to the influence of random variation. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP5899810(B2) 申请公布日期 2016.04.06
申请号 JP20110240090 申请日期 2011.11.01
申请人 富士通株式会社 发明人 金澤 裕治
分类号 G06F17/50 主分类号 G06F17/50
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