发明名称 |
SUBSTRATE PROCESSING APPARATUS, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND STORAGE MEDIUM |
摘要 |
The characteristic of a layer formed on a substrate is improved. Also, manufacturing throughput is improved. A substrate processing apparatus has a process chamber which accommodates a substrate, a first process gas supplying part which supplies a first process gas to the substrate, a second process gas supplying part which supplies a second process gas to the substrate, a vaporizer residue measuring part which measures the residual quantity of the first gas in a vaporizer installed to the first process gas supplying part, and a control part which changes the number of cycles for supplying the first process gas and the second process gas based on the residual quantity measured by the vaporizer residue measuring part. |
申请公布号 |
KR20160037748(A) |
申请公布日期 |
2016.04.06 |
申请号 |
KR20150121269 |
申请日期 |
2015.08.27 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
ASHIHARA HIROSHI;OHASHI NAOFUMI |
分类号 |
H01L21/02;H01L21/027;H01L21/205 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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