发明名称 Tunable band-pass filter
摘要 Optical filters and methods of making optical filters are provided. The optical filter can include a first and second stack of layers. The first stack of layers can be configured to provide a cut-on edge for s-polarized radiation incident at a second wavelength value and a cut-off edge for s-polarized radiation incident at a third wavelength value. The second stack of layers can be configured to provide a cut-off edge for s-polarized radiation incident on the second stack of layers at a fourth wavelength value. Further, the fourth wavelength value can lie between the second wavelength value and the third wavelength value. Furthermore, a curve or line of full-width half-maximum (FWHM) values of the optical filter pass-band can define a first derivative with respect to angle-of-incidence values at at least one angle-of-incidence value that is substantially positive or substantially zero.
申请公布号 US9304237(B1) 申请公布日期 2016.04.05
申请号 US201213710367 申请日期 2012.12.10
申请人 Semrock, Inc. 发明人 Wang Ligang;Erdogan Turan
分类号 G02B5/28 主分类号 G02B5/28
代理机构 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP 代理人 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
主权项 1. An optical filter configured to provide a wavelength-tunable pass-band to incident s-polarized electromagnetic radiation, the optical filter comprising: a first stack of layers; and a second stack of layers; wherein the first stack of layers comprises a plurality of quarter-wave layers and at least two half-wave cavity layers; wherein an optical thickness value of each quarter-wave layer in the first stack of layers is approximately an odd-integer multiple of one-fourth of a first wavelength value; wherein an optical thickness value of each half-wave cavity layer in the first stack of layers is approximately an integer multiple of one-half of the first wavelength value; wherein the first stack of layers is configured to provide a cut-on edge for s-polarized radiation incident on the first stack of layers at a second wavelength value, the second wavelength value being a function of angle-of-incidence for a set of non-normal angle-of-incidence values; wherein the first stack of layers is configured to provide a cut-off edge for s-polarized radiation incident on the first stack of layers at a third wavelength value, the third wavelength value being a function of angle-of-incidence for the set of non-normal angle-of-incidence values; wherein the third wavelength value is greater than the second wavelength value at the set of non-normal angle-of-incidence values; wherein the second stack of layers is configured to provide a cut-off edge for s-polarized radiation incident on the second stack of layers at a fourth wavelength value, the fourth wavelength value being a function of angle-of-incidence for the set of non-normal angle-of-incidence values; wherein the fourth wavelength value lies substantially between the second wavelength value and the third wavelength value at the set of non-normal angle-of-incidence values; wherein a pass-band determined by the second wavelength value and the fourth wavelength value has a set of associated full-width half-maximum values as a function of angle-of-incidence for the set of non-normal angle-of-incidence values, the set of associated full-width half-maximum values substantially defining at least one of: a FWHM curve as a function of angle-of-incidence and a FWHM line as a function of angle-of-incidence; and wherein the at least one of a FWHM curve and a FWHM line define a first derivative with respect to angle-of-incidence values at at least one angle-of-incidence value of the set of non-normal angle-of-incidence values that is at least one of: substantially positive and substantially zero.
地址 Rochester NY US