发明名称 |
Tunable band-pass filter |
摘要 |
Optical filters and methods of making optical filters are provided. The optical filter can include a first and second stack of layers. The first stack of layers can be configured to provide a cut-on edge for s-polarized radiation incident at a second wavelength value and a cut-off edge for s-polarized radiation incident at a third wavelength value. The second stack of layers can be configured to provide a cut-off edge for s-polarized radiation incident on the second stack of layers at a fourth wavelength value. Further, the fourth wavelength value can lie between the second wavelength value and the third wavelength value. Furthermore, a curve or line of full-width half-maximum (FWHM) values of the optical filter pass-band can define a first derivative with respect to angle-of-incidence values at at least one angle-of-incidence value that is substantially positive or substantially zero. |
申请公布号 |
US9304237(B1) |
申请公布日期 |
2016.04.05 |
申请号 |
US201213710367 |
申请日期 |
2012.12.10 |
申请人 |
Semrock, Inc. |
发明人 |
Wang Ligang;Erdogan Turan |
分类号 |
G02B5/28 |
主分类号 |
G02B5/28 |
代理机构 |
Finnegan, Henderson, Farabow, Garrett & Dunner, LLP |
代理人 |
Finnegan, Henderson, Farabow, Garrett & Dunner, LLP |
主权项 |
1. An optical filter configured to provide a wavelength-tunable pass-band to incident s-polarized electromagnetic radiation, the optical filter comprising:
a first stack of layers; and a second stack of layers; wherein the first stack of layers comprises a plurality of quarter-wave layers and at least two half-wave cavity layers; wherein an optical thickness value of each quarter-wave layer in the first stack of layers is approximately an odd-integer multiple of one-fourth of a first wavelength value; wherein an optical thickness value of each half-wave cavity layer in the first stack of layers is approximately an integer multiple of one-half of the first wavelength value; wherein the first stack of layers is configured to provide a cut-on edge for s-polarized radiation incident on the first stack of layers at a second wavelength value, the second wavelength value being a function of angle-of-incidence for a set of non-normal angle-of-incidence values; wherein the first stack of layers is configured to provide a cut-off edge for s-polarized radiation incident on the first stack of layers at a third wavelength value, the third wavelength value being a function of angle-of-incidence for the set of non-normal angle-of-incidence values; wherein the third wavelength value is greater than the second wavelength value at the set of non-normal angle-of-incidence values; wherein the second stack of layers is configured to provide a cut-off edge for s-polarized radiation incident on the second stack of layers at a fourth wavelength value, the fourth wavelength value being a function of angle-of-incidence for the set of non-normal angle-of-incidence values; wherein the fourth wavelength value lies substantially between the second wavelength value and the third wavelength value at the set of non-normal angle-of-incidence values; wherein a pass-band determined by the second wavelength value and the fourth wavelength value has a set of associated full-width half-maximum values as a function of angle-of-incidence for the set of non-normal angle-of-incidence values, the set of associated full-width half-maximum values substantially defining at least one of: a FWHM curve as a function of angle-of-incidence and a FWHM line as a function of angle-of-incidence; and wherein the at least one of a FWHM curve and a FWHM line define a first derivative with respect to angle-of-incidence values at at least one angle-of-incidence value of the set of non-normal angle-of-incidence values that is at least one of:
substantially positive and substantially zero. |
地址 |
Rochester NY US |