发明名称 |
Semiconductor devices and structures |
摘要 |
An Integrated Circuit device including: a first layer including first transistors; a first metal layer overlaying the first transistors and providing at least one connection to the first transistors; a second metal layer overlaying the first metal layer; and a second layer including second transistors overlaying the second metal layer, where the second metal layer is connected to provide power to at least one of the second transistors and a connection path between the second transistors and the second metal layer, where the connection path includes at least one through-layer via, and where the through-layer via has a diameter less than 150 nm. |
申请公布号 |
US9305867(B1) |
申请公布日期 |
2016.04.05 |
申请号 |
US201414472108 |
申请日期 |
2014.08.28 |
申请人 |
MONOLITHIC 3D INC. |
发明人 |
Or-Bach Zvi;Sekar Deepak C.;Cronquist Brian |
分类号 |
H01L21/44;H01L21/48;H01L21/50;H01L23/48;H01L23/50;H01L23/34;H01L27/088 |
主分类号 |
H01L21/44 |
代理机构 |
Tran & Associates |
代理人 |
Tran & Associates |
主权项 |
1. An Integrated Circuit device, comprising:
a first layer comprising first transistors; a first metal layer overlaying said first transistors and providing at least one connection to said first transistors; a second metal layer overlaying said first metal layer; and a second layer comprising second transistors overlaying said second metal layer,
wherein said second metal layer is connected to provide power to at least one of said second transistors; and a connection path between said second transistors and said second metal layer,
wherein said connection path comprises at least one through-layer via, andwherein said through-layer via has a diameter less than 150 nm. |
地址 |
San Jose CA US |