发明名称 Semiconductor devices and structures
摘要 An Integrated Circuit device including: a first layer including first transistors; a first metal layer overlaying the first transistors and providing at least one connection to the first transistors; a second metal layer overlaying the first metal layer; and a second layer including second transistors overlaying the second metal layer, where the second metal layer is connected to provide power to at least one of the second transistors and a connection path between the second transistors and the second metal layer, where the connection path includes at least one through-layer via, and where the through-layer via has a diameter less than 150 nm.
申请公布号 US9305867(B1) 申请公布日期 2016.04.05
申请号 US201414472108 申请日期 2014.08.28
申请人 MONOLITHIC 3D INC. 发明人 Or-Bach Zvi;Sekar Deepak C.;Cronquist Brian
分类号 H01L21/44;H01L21/48;H01L21/50;H01L23/48;H01L23/50;H01L23/34;H01L27/088 主分类号 H01L21/44
代理机构 Tran & Associates 代理人 Tran & Associates
主权项 1. An Integrated Circuit device, comprising: a first layer comprising first transistors; a first metal layer overlaying said first transistors and providing at least one connection to said first transistors; a second metal layer overlaying said first metal layer; and a second layer comprising second transistors overlaying said second metal layer, wherein said second metal layer is connected to provide power to at least one of said second transistors; and a connection path between said second transistors and said second metal layer, wherein said connection path comprises at least one through-layer via, andwherein said through-layer via has a diameter less than 150 nm.
地址 San Jose CA US