发明名称 Temperature measurement apparatus and method
摘要 A temperature measurement apparatus includes a light source; a first splitter that splits a light beam into a measurement beam and a reference beam; a reference beam reflector that reflects the reference beam; an optical path length adjustor; a second splitter that splits the reflected reference beam into a first reflected reference beam and a second reflected reference beam; a first photodetector that measures an interference between the first reflected reference beam and a reflected measurement beam obtained by the measurement beam reflected from a target object; a second photodetector that measures an intensity of the second reflected reference beam; and a temperature calculation unit. The temperature calculation unit calculates a location of the interference by subtracting an output signal of the second photodetector from an output signal of the first photodetector, and calculates a temperature of the target object from the calculated location of the interference.
申请公布号 US9304050(B2) 申请公布日期 2016.04.05
申请号 US201314070714 申请日期 2013.11.04
申请人 TOKYO ELECTRON LIMITED 发明人 Abe Jun;Matsudo Tatsuo;Koshimizu Chishio
分类号 G01K11/00;G01B9/02;G01K11/12 主分类号 G01K11/00
代理机构 Rothwell, Figg, Ernst & Manbeck, P.C. 代理人 Rothwell, Figg, Ernst & Manbeck, P.C.
主权项 1. A temperature measurement method, comprising: splitting a low coherence light beam into a reference beam and a measurement beam; radiating the reference beam onto a reference beam reflector while radiating the measurement beam onto a target object; measuring an interference between the reference beam reflected from the reference beam reflector and the measurement beam reflected from the target object while changing an optical path length of the reflected reference beam by moving the reference beam reflector in one direction; and subtracting a signal, obtained when only the reflected reference beam is detected while the optical path length of the reflected reference beam is changed, from a signal obtained from the interference measurement, calculating a location of the interference by the subtraction, and calculating a temperature of the target object from the calculated location of the interference.
地址 Tokyo JP