| 发明名称 | Electron gun abnormality detecting device and electron gun abnormality detecting method | ||
| 摘要 | An electron gun abnormality detecting device for detecting an abnormality in first and second electron guns of a magnetic domain refining device for an electrical steel sheet includes: a magnetooptic element configured to contact with and separate from an inspection region set to include a boundary between a magnetic domain discontinuity generated by irradiation of a surface of the electrical steel sheet with an electron beam by the first electron gun and a magnetic domain discontinuity generated by irradiation thereof with an electron beam by the second electron gun, and configured to detect a steel sheet magnetic domain structure in the inspection region as an optical property; a light source configured to irradiate the magnetooptic element with linearly polarized light; and a detector configured to detect polarized light rotated by the steel sheet magnetic domain structure transferred to the magnetooptic element. | ||
| 申请公布号 | US9304078(B2) | 申请公布日期 | 2016.04.05 |
| 申请号 | US201314431221 | 申请日期 | 2013.09.25 |
| 申请人 | JFE STEEL CORPORATION | 发明人 | Ito Tomohiko;Yotsuji Junichi;Takajo Shigehiro;Yamaguchi Hiroi;Hanazawa Kazuhiro;Koga Yasunari |
| 分类号 | G01J4/00;G01N21/21;G01R33/032;H01J29/48 | 主分类号 | G01J4/00 |
| 代理机构 | Oliff PLC | 代理人 | Oliff PLC |
| 主权项 | 1. An electron gun abnormality detecting device for detecting an abnormality in electron guns of a magnetic domain refining device for an electrical steel sheet, the magnetic domain refining device including at least a first electron gun and a second electron gun, and the electron gun abnormality detecting device comprising: a magnetooptic element configured to contact with and separate from an inspection region set to include a boundary between a magnetic domain discontinuity generated by irradiation of a surface of the electrical steel sheet with an electron beam by the first electron gun and a magnetic domain discontinuity generated by irradiation thereof with an electron beam by the second electron gun, and configured to detect a steel sheet magnetic domain structure in the inspection region as an optical property; a light source configured to irradiate the magnetooptic element with linearly polarized light; and a detector configured to detect polarized light rotated by the steel sheet magnetic domain structure transferred to the magnetooptic element. | ||
| 地址 | Tokyo JP | ||