发明名称 Image measurement apparatus, image measurement method and image measurement program
摘要 Two-dimensional measurement is allowed with a small error even in the case where a difference occurs between a measurement plane for a workpiece and a plane with calibrated external parameters. When the workpiece 2 is gripped by a holding device 3, an image measurement apparatus 1 calculates the difference between the calibration plane 17 where the external parameters are calibrated and the measurement plane 20 for the workpiece 2. The image measurement apparatus 1 corrects the external parameters such that the calibration plane 17 coincides with the measurement plane 20, and two-dimensionally measures the workpiece 2 using the corrected external parameters.
申请公布号 US9303988(B2) 申请公布日期 2016.04.05
申请号 US201313868243 申请日期 2013.04.23
申请人 Canon Kabushiki Kaisha 发明人 Tani Kota
分类号 G01C11/02;G01B11/00;G01B11/245 主分类号 G01C11/02
代理机构 Fitzpatrick, Cella, Harper & Scinto 代理人 Fitzpatrick, Cella, Harper & Scinto
主权项 1. An image measurement apparatus, comprising: a first camera that takes an image of a workpiece held by a holding device; a detecting device provided on the holding device that detects a position and/or a posture of a measurement plane for the workpiece held by the holding device; and a control unit that stores external parameters of the first camera and a position and/or a posture of a calibration plane where the external parameters are calibrated, stores the position and/or the posture of the measurement plane for the workpiece detected by the detecting device while the workpiece is held by the holding device, corrects the external parameters based on a detected value by the detecting device such that the positions and/or the postures of the measurement plane and the calibration plane coincide with each other, and measures a two-dimensional position and/or a posture of the workpiece held by the holding device from the image taken by the first camera using the corrected external parameters.
地址 Tokyo JP