发明名称 |
PHASE SHIFT BLANKMASK AND PHOTOMASK |
摘要 |
The present invention provides a phase inversion blank mask and a photomask using the same, forming a phase inversion film with a metal silicide compound, so pattern formation can be easily controlled when a pattern is formed. In the phase inversion blank mask having a phase inversion film and a shading membrane on a transparent substrate, the phase inversion film has transmittance of 1 to 30% for exposure light of g-line, h-line, and i-line individually. |
申请公布号 |
KR20160036956(A) |
申请公布日期 |
2016.04.05 |
申请号 |
KR20140129339 |
申请日期 |
2014.09.26 |
申请人 |
S&STECH CO., LTD. |
发明人 |
NAM, KEE SOO;SHIN, CHEOL;LEE, JONG HWA;YANG, CHUL KYU;CHOI, MIN KI;KIM, CHANG JUN;JANG, KYU JIN |
分类号 |
H01L21/027;G06F1/26 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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