发明名称 PHASE SHIFT BLANKMASK AND PHOTOMASK
摘要 The present invention provides a phase inversion blank mask and a photomask using the same, forming a phase inversion film with a metal silicide compound, so pattern formation can be easily controlled when a pattern is formed. In the phase inversion blank mask having a phase inversion film and a shading membrane on a transparent substrate, the phase inversion film has transmittance of 1 to 30% for exposure light of g-line, h-line, and i-line individually.
申请公布号 KR20160036956(A) 申请公布日期 2016.04.05
申请号 KR20140129339 申请日期 2014.09.26
申请人 S&STECH CO., LTD. 发明人 NAM, KEE SOO;SHIN, CHEOL;LEE, JONG HWA;YANG, CHUL KYU;CHOI, MIN KI;KIM, CHANG JUN;JANG, KYU JIN
分类号 H01L21/027;G06F1/26 主分类号 H01L21/027
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