| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray intensity modulation mechanism capable of previous production or switching of a highly-flexible intensity pattern, and to provide an X-ray polarization analysis technology utilizing the intensity modulation mechanism.SOLUTION: By utilizing the fact that diffraction intensity of an X-ray by a magnetic substance 1 depends on a magnetization state of the magnetic substance 1, the magnetization state or a magnetization direction of the magnetic substance 1 is operated, to thereby modulate X-ray intensity. Further, a polarization state of the X-ray is analyzed by utilizing the fact that the phenomenon that the diffraction intensity of the X-ray by the magnetic substance 1 depends on the magnetization state of the magnetic substance also depends on the polarization state of an incident X-ray.SELECTED DRAWING: Figure 1 |
