发明名称 THICKNESS MEASURING APPARATUS USING OPTICAL DISTANCE DETECTOR
摘要 PROBLEM TO BE SOLVED: To provide a thickness measuring apparatus that can easily correct thickness measurement errors by simple heat insulating means by detecting displacements of its distances from the reference positions of optical distance detectors.SOLUTION: A thickness measuring apparatus using a pair of optical distance detectors 1T and 1B that figure out distances from a measurement object 30 is equipped with a gate-shaped frame 20 supporting the optical distance detectors, an upper guide rail 2T, a lower guide rail 2B, a laser beam projector 4 fixed integrally with the optical base of the front side optical distance detector and a pair of laser beam position detectors 5R and 5L fixed to the right and left supports of the gate-shaped frame. A thickness output figured out by a thickness calculator 11 is corrected with reference to outputs of a position calculator 15 that calculates any displacement of the distance from a reference position and any displacement of the angle relative to a vertical direction, of a thickness measuring position controller 13 that shifts to the thickness measuring position, and of the position calculator and the thickness measuring position controller.SELECTED DRAWING: Figure 1
申请公布号 JP2016044970(A) 申请公布日期 2016.04.04
申请号 JP20140166798 申请日期 2014.08.19
申请人 TOSHIBA CORP 发明人 TAKEMURA SHOTA;AIZAWA KENJI
分类号 G01B11/06 主分类号 G01B11/06
代理机构 代理人
主权项
地址