发明名称 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a resist composition that can achieve high sensitivity and allows formation of a resist pattern with high resolution.SOLUTION: The resist composition comprises a polymeric compound having such a structural unit that is derived from an acrylate in which a hydrogen atom bonded to a carbon atom at an α-position may be replaced by a substituent and that has a lactone group-containing cyclic group containing a group represented by general formula (a0-r-1) in a side chain terminal. In formula (a0-r-1), Raand Raeach independently represent a hydrogen atom or a non-aromatic hydrocarbon group which may have a substituent, or Raand Ramay be bonded to each other to form a ring together with a carbon atom to which Rais bonded and with a nitrogen atom to which Rais bonded; and * represents a bond.SELECTED DRAWING: None
申请公布号 JP2016045472(A) 申请公布日期 2016.04.04
申请号 JP20140172077 申请日期 2014.08.26
申请人 TOKYO OHKA KOGYO CO LTD 发明人 KOMURO YOSHITAKA;YAMASHITA NAOKI;HIRANO TOMOYUKI
分类号 G03F7/039;C08F20/36;H01L21/027 主分类号 G03F7/039
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