发明名称 |
RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To provide a resist composition that can achieve high sensitivity and allows formation of a resist pattern with high resolution.SOLUTION: The resist composition comprises a polymeric compound having such a structural unit that is derived from an acrylate in which a hydrogen atom bonded to a carbon atom at an α-position may be replaced by a substituent and that has a lactone group-containing cyclic group containing a group represented by general formula (a0-r-1) in a side chain terminal. In formula (a0-r-1), Raand Raeach independently represent a hydrogen atom or a non-aromatic hydrocarbon group which may have a substituent, or Raand Ramay be bonded to each other to form a ring together with a carbon atom to which Rais bonded and with a nitrogen atom to which Rais bonded; and * represents a bond.SELECTED DRAWING: None |
申请公布号 |
JP2016045472(A) |
申请公布日期 |
2016.04.04 |
申请号 |
JP20140172077 |
申请日期 |
2014.08.26 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
KOMURO YOSHITAKA;YAMASHITA NAOKI;HIRANO TOMOYUKI |
分类号 |
G03F7/039;C08F20/36;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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