发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To delay performance deterioration of an element having an increased thermal density due to microfabrication and subject to severe thermal stress, thereby reducing the occurrence of failures.SOLUTION: A detection is made that a temperature of each arithmetic element exceeds a threshold, the excess time is measured and compared, and periods of time in which thermal stresses are applied are compared with each other. The thermal stress is averaged by using the arithmetic element in order from one having the shortest period of time.SELECTED DRAWING: Figure 1
申请公布号 JP2016045823(A) 申请公布日期 2016.04.04
申请号 JP20140171162 申请日期 2014.08.26
申请人 CANON INC 发明人 ONISHI MASAJI
分类号 G06F9/50;G06F15/78;H01L21/822;H01L27/04 主分类号 G06F9/50
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