| 摘要 |
PROBLEM TO BE SOLVED: To acquire an inspection result on a state of an individual circuit in increased accuracy, on the basis of an actual measurement value.SOLUTION: When abnormal individual circuits DCU and normal individual circuits DCU are mixed among a plurality of individual circuits DCU in a circuit network, the following steps are executed. In the step 86, a failure net list is created regarding the circuit network in which the abnormal individual circuit DCU is failed. In the step 87, by using the failure net list, a simulation value regarding the normal individual circuit DCU is acquired by simulation. In the step 88, simulation is performed for the normal individual circuit DCU by comparing a corresponding reference region with the above simulation value, and on the basis of an inspection result of the simulation, in the step 89, a state inspection result REm based on an actual measurement value is verified.SELECTED DRAWING: Figure 3 |
