发明名称 DESIGN SUPPORT APPARATUS, DESIGN SUPPORT METHOD, DESIGN SUPPORT PROGRAM, AND METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To reduce design construction period of a semiconductor integrated circuit.SOLUTION: A design support apparatus of a semiconductor integrated circuit includes: data read means which reads arrangement wiring information and setting information of electromigration analysis; first generation means which generates constrains on the electromigration analysis, on the basis of the setting information; analysis means which performs the electromigration analysis, on the basis of the constrains on the electromigration analysis; and second generation means which specifies the content and location of an electromigration error, on the basis of a result of analysis, to generate constraints on arrangement wiring.SELECTED DRAWING: Figure 1
申请公布号 JP2016045548(A) 申请公布日期 2016.04.04
申请号 JP20140167221 申请日期 2014.08.20
申请人 RICOH CO LTD 发明人 NAKANE NOBUO
分类号 G06F17/50;H01L21/82;H01L21/822;H01L27/04 主分类号 G06F17/50
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