发明名称 ILLUMINANCE MEASURING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an illuminance measuring system that can accurately associate the illuminance measuring position and the result of illuminance measurement with each other and thereby enhance the reproducibility of illuminance measurement.SOLUTION: An illuminance measuring system is equipped with an illuminance measuring device 2 having a first communication unit, position measuring means 1 that can measure the three-dimensional position of the illuminance measuring device, and a data collector 5 having a second communication unit. The illuminance is measured with the illuminance measuring device, the position of the illuminance measuring device having measured the illuminance is measured with the position measuring means; the data collector acquires the result of illuminance measurement and the measuring position from the illuminance measuring device and the position measuring means, and collects the result of illuminance measurement and the measuring position associated with each other.SELECTED DRAWING: Figure 1
申请公布号 JP2016045002(A) 申请公布日期 2016.04.04
申请号 JP20140167378 申请日期 2014.08.20
申请人 TOPCON CORP 发明人 SAWAGUCHI SHIGEYUKI;ISOZAKI HISASHI;NAGASHIMA TERUKAZU
分类号 G01J1/42;G01C15/00 主分类号 G01J1/42
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