发明名称 SILICON CARBIDE EPITAXIAL WAFER, SILICON CARBIDE SEMICONDUCTOR DEVICE, AND PRODUCTION METHOD OF SILICON CARBIDE EPITAXIAL WAFER
摘要 PROBLEM TO BE SOLVED: To obtain a high element yield by an easily-producible silicon carbide epitaxial wafer.SOLUTION: A silicon carbide epitaxial wafer includes a silicon carbide substrate, and a silicon carbide epitaxial growth layer formed on a first principal surface of the silicon carbide substrate, and doped with impurities at a lower concentration than the silicon carbide substrate. A plurality of grooves are formed on a second principal surface facing to the first principal surface of the silicon carbide substrate.SELECTED DRAWING: Figure 1
申请公布号 JP2016044115(A) 申请公布日期 2016.04.04
申请号 JP20140172272 申请日期 2014.08.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 SAKAI MASA;MITANI YOICHIRO;TANAKA TAKANORI;KIMURA YASUHIRO;TOMITA NOBUYUKI
分类号 C30B29/36;C23C16/42;C30B25/20;H01L21/20;H01L21/205;H01L21/336;H01L29/12;H01L29/47;H01L29/78;H01L29/872 主分类号 C30B29/36
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