发明名称 |
SILICON CARBIDE EPITAXIAL WAFER, SILICON CARBIDE SEMICONDUCTOR DEVICE, AND PRODUCTION METHOD OF SILICON CARBIDE EPITAXIAL WAFER |
摘要 |
PROBLEM TO BE SOLVED: To obtain a high element yield by an easily-producible silicon carbide epitaxial wafer.SOLUTION: A silicon carbide epitaxial wafer includes a silicon carbide substrate, and a silicon carbide epitaxial growth layer formed on a first principal surface of the silicon carbide substrate, and doped with impurities at a lower concentration than the silicon carbide substrate. A plurality of grooves are formed on a second principal surface facing to the first principal surface of the silicon carbide substrate.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016044115(A) |
申请公布日期 |
2016.04.04 |
申请号 |
JP20140172272 |
申请日期 |
2014.08.27 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
SAKAI MASA;MITANI YOICHIRO;TANAKA TAKANORI;KIMURA YASUHIRO;TOMITA NOBUYUKI |
分类号 |
C30B29/36;C23C16/42;C30B25/20;H01L21/20;H01L21/205;H01L21/336;H01L29/12;H01L29/47;H01L29/78;H01L29/872 |
主分类号 |
C30B29/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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