发明名称 METHOD FOR ETCHING OBJECT TO BE PROCESSED
摘要 PROBLEM TO BE SOLVED: To suppress the degradation of an electric property of a multilayered film, and to enhance the verticality of a side wall face of the multilayered film after etching.SOLUTION: According to an embodiment, a method for etching an object to be processed through a mask is provided, in which the object to be processed includes a lower electrode, and a multilayered film provided on the lower electrode, and including a first magnetic layer, a second magnetic layer and an insulator layer interposed between the first and second magnetic layers. The method comprises the step of exposing the object to be processed to plasma of a first process gas including a first inert gas and a second inert gas larger than the first inert gas in atomic number, but no hydrogen gas.SELECTED DRAWING: Figure 1
申请公布号 JP2016046470(A) 申请公布日期 2016.04.04
申请号 JP20140171686 申请日期 2014.08.26
申请人 TOKYO ELECTRON LTD 发明人 MORIMOTO TAMOTSU;KO SHOJUN
分类号 H01L21/3065;H01L21/8246;H01L27/105;H01L43/08;H01L43/12 主分类号 H01L21/3065
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