发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing apparatus which enables improvement of uniformity of gas flow in a processing container while maintaining a function of a service port provided at the processing container.SOLUTION: A substrate processing apparatus 1 includes: a processing container 10; a placement base 11; a division wall 12; a lifting mechanism 32 which moves up or down the division wall 12; a service port 40 provided on a side wall of the processing container 10; a first seal mechanism 50 provided at a position of the service port 40 in the processing container 10; and a second seal mechanism 60 provided at a position of the division wall 12 which faces the service port 40. A first seal surface 52 of the first seal mechanism 50 and a second seal surface of the second seal mechanism 60 are provided at positions such that the seal surfaces contact with each other when the division wall 12 is moved to a substrate processing position.SELECTED DRAWING: Figure 1
申请公布号 JP2016046365(A) 申请公布日期 2016.04.04
申请号 JP20140169222 申请日期 2014.08.22
申请人 TOKYO ELECTRON LTD 发明人 HAYASHI KAZUICHI
分类号 H01L21/302;H01L21/3065;H01L21/683 主分类号 H01L21/302
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