发明名称 FUSIBLE INSTRUCTIONS AND LOGIC TO REALIZE OR-TEST AND AND-TEST FUNCTIONALITY USING MULTIPLE TEST SOURCES
摘要 PROBLEM TO BE SOLVED: To provide fusible instructions and logic to realize OR-test and AND-test functionality on multiple test sources.SOLUTION: A test instruction specifies first, second and third source data operands, and an operation type. Execution units, in response to the decoded test instruction, perform one logical operation, according to the specified operation type, between data from the first and second source data operands, and perform a second logical operation between the data from the third source data operand and the result of the first logical operation to set a condition flag. The test instruction is generated dynamically by fusing one logical instruction with a prior-art test instruction. The test instruction may be generated through a just-in-time compiler. Further, the test instruction is fused with a subsequent conditional branch instruction, and a branch is performed according to how the condition flag is set.SELECTED DRAWING: Figure 15A
申请公布号 JP2016042382(A) 申请公布日期 2016.03.31
申请号 JP20150229032 申请日期 2015.11.24
申请人 INTEL CORP 发明人 LOKTYUKHIN MAXIM;ROBERT VALENTINE;JULIAN C HORN;MARK J CHARNEY
分类号 G06F9/318;G06F9/305 主分类号 G06F9/318
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