发明名称 |
EPITAXIALLY GROWN QUANTUM WELL FINFETS FOR ENHANCED PFET PERFORMANCE |
摘要 |
A method of forming a quantum well having a conformal epitaxial well on a {100} crystallographic orientated fin. The method may include: forming fins in a {100} crystallographic oriented substrate; forming a conformal well on the fins using epitaxial growth; and forming a conformal barrier on the conformal well using epitaxial growth. |
申请公布号 |
US2016093613(A1) |
申请公布日期 |
2016.03.31 |
申请号 |
US201414497380 |
申请日期 |
2014.09.26 |
申请人 |
International Business Machines Corporation |
发明人 |
Bergendahl Marc A.;Demarest James J.;He Hong;Knupp Seth L.;Sreenivasan Raghavasimhan;Teehan Sean;Upham Allan W.;Yang Chih-Chao |
分类号 |
H01L27/088;H01L29/04;H01L29/12;H01L21/762;H01L21/8234;H01L29/66;H01L21/02;H01L29/78;H01L29/06 |
主分类号 |
H01L27/088 |
代理机构 |
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代理人 |
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主权项 |
1. A method comprising:
forming a pad layer on a {100} crystallographic oriented substrate; forming a mandrel on the pad layer, wherein the pad layer is an oxide layer on a nitride layer; forming spacers on sidewalls of the mandrel, wherein the spacers are silicon nitride; forming a spacer pattern by removing the mandrel from in-between the spacers; transferring the spacer pattern into the oxide layer using the nitride layer as an etch stop; transferring the spacer pattern into the nitride layer and simultaneously removing the spacers from above the oxide layer; forming fins in the substrate by transferring the spacer pattern in the nitride layer into the substrate; forming a recessed oxide fill on the substrate and in-between the fins, a top surface of the recessed oxide fill is below a top surface of the fins; forming a conformal well on the fins using epitaxial growth; and forming a conformal barrier on the conformal well using epitaxial growth, wherein the conformal well is in-between the fins and the conformal barrier, the conformal well has a lower band-gap than the conformal barrier and the fins. |
地址 |
Armonk NY US |