发明名称 |
CHARACTERIZATION OF TRACE CRYSTALLINITY BY SECOND HARMONIC GENERATION MICROSCOPY |
摘要 |
A method for quantifying crystallinity within a sample using second harmonic generation microscopy is described herein. In one aspect, a method for reducing the timeframe for accelerated stability testing of amorphous solid dispersions of active pharmaceutical ingredients though identifying regions of interest to quantify crystallinity and composition is presented herein. |
申请公布号 |
WO2016049623(A1) |
申请公布日期 |
2016.03.31 |
申请号 |
WO2015US52604 |
申请日期 |
2015.09.28 |
申请人 |
PURDUE RESEARCH FOUNDATION |
发明人 |
SIMPSON, GARTH JASON;SCHMITT, PAUL DAVID |
分类号 |
G01N23/20 |
主分类号 |
G01N23/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|