发明名称 CHARACTERIZATION OF TRACE CRYSTALLINITY BY SECOND HARMONIC GENERATION MICROSCOPY
摘要 A method for quantifying crystallinity within a sample using second harmonic generation microscopy is described herein. In one aspect, a method for reducing the timeframe for accelerated stability testing of amorphous solid dispersions of active pharmaceutical ingredients though identifying regions of interest to quantify crystallinity and composition is presented herein.
申请公布号 WO2016049623(A1) 申请公布日期 2016.03.31
申请号 WO2015US52604 申请日期 2015.09.28
申请人 PURDUE RESEARCH FOUNDATION 发明人 SIMPSON, GARTH JASON;SCHMITT, PAUL DAVID
分类号 G01N23/20 主分类号 G01N23/20
代理机构 代理人
主权项
地址