发明名称 METHOD FOR MANUFACTURING WIRING STRUCTURE, COPPER DISPLACEMENT PLATING SOLUTION, AND WIRING STRUCTURE
摘要 Adhesion of an underlying diffusion barrier metal film and an electroless copper plating film with respect to an insulating film can be improved. A method for manufacturing a wiring structure includes a process of forming the underlying diffusion barrier metal film 5, including a base metal with respect to copper, on the insulating film 1; and a process of forming the electroless copper plating film 6 on the underlying diffusion barrier metal film 5 by performing an electroless copper displacement plating process with a copper displacement plating solution. The copper displacement plating solution is an acidic copper displacement plating solution of pH1 to pH4, in which copper ions are contained but a reducing agent for reducing the copper ions is not contained.
申请公布号 US2016095228(A1) 申请公布日期 2016.03.31
申请号 US201514865143 申请日期 2015.09.25
申请人 Tokyo Electron Limited ;A School Corporation Kansai University 发明人 Shinguhara Shoso;Ota Kohei;Iwashita Mitsuaki;Mizutani Nobutaka
分类号 H05K3/18;H05K1/09 主分类号 H05K3/18
代理机构 代理人
主权项 1. A method for manufacturing a wiring structure, comprising: a process of forming an underlying diffusion barrier metal film, including a base metal with respect to copper, on an insulating film; and a process of forming an electroless copper plating film on the underlying diffusion barrier metal film by performing an electroless copper displacement plating process with a copper displacement plating solution, wherein the copper displacement plating solution is an acidic copper displacement plating solution of pH1 to pH4, in which copper ions are contained but a reducing agent for reducing the copper ions is not contained.
地址 Tokyo JP