发明名称 |
SURFACE HARDNESS EVALUATION METHOD USING X-RAY DIFFRACTOMETER, AND X-RAY DIFFRACTION MEASURING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To determine surface hardness of a measuring object accurately by one-time formation of an X-ray diffraction image.SOLUTION: An X-ray is emitted toward a measuring object OB, and a diffraction ring is imaged by generated diffraction light of the X-ray. An intensity distribution of a diffraction X-ray of the imaged diffraction ring is detected, and a diffraction ring width which is a width based on the intensity distribution in the radial direction of the diffraction ring is calculated at a plurality of spots thereof and averaged. A surface hardness of the measuring object OB is calculated by using the obtained average value, and a relation between the diffraction ring width and the surface hardness which is obtained beforehand.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016042050(A) |
申请公布日期 |
2016.03.31 |
申请号 |
JP20140165625 |
申请日期 |
2014.08.18 |
申请人 |
ISHIKAWA PREFECTURE;PULSTEC INDUSTRIAL CO LTD |
发明人 |
TAKAAI SHIGEKI;YASUI HARUYUKI;SAKATANI KATSUAKI;SASAKI TOSHIHIKO;UCHIYAMA MUNEHISA;MARUYAMA YOICHI |
分类号 |
G01N23/20 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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