发明名称 DUAL WORK FUNCTION BURIED GATE TYPE TRANSISTOR AND METHOD FOR FABRICATING THE SAME
摘要 A transistor includes a substrate having an active region defined by an isolation layer; a first trench defined in the active region and a second trench defined in the isolation layer; a fin region formed under the first trench; and a buried gate electrode covering sidewalls of the fin region and filling the first and second trenches. The buried gate electrode includes a first work function layer formed on the sidewalls of the fin region; a second work function layer formed on sidewalls of the first trench and the second trench; a third work function layer positioned over the fin region and contacting the second work function layer; and a low resistance layer contacting the third work function layer and partially filling the first and second trenches.
申请公布号 US2016093717(A1) 申请公布日期 2016.03.31
申请号 US201514965325 申请日期 2015.12.10
申请人 SK hynix Inc. 发明人 OH Tae-Kyung
分类号 H01L29/66;H01L21/311;H01L21/28;H01L21/306;H01L29/423;H01L29/06 主分类号 H01L29/66
代理机构 代理人
主权项
地址 Gyeonggi-do KR
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