发明名称 Modulation of Instrument Resolution Dependant upon the Complexity of a Previous Scan
摘要 Systems and methods are used to analyze a sample using variable detection scan resolutions. A tandem mass spectrometer is instructed to perform at least two scans of a sample with different detection scan resolutions using a processor. The tandem mass spectrometer includes a mass analyzer that allows variable detection scan resolutions. The selection of the different detection scan resolutions can be based on one or more properties of sample compounds. The properties may include a sample compound molecular weight distribution that is calculated from a molecular weight distribution of expected compounds or is determined from a list of molecular weights for one or more known compounds. The tandem mass spectrometer can also be instructed to perform an analysis of the sample before instructing the tandem mass spectrometer to perform the at least two scans of the sample.
申请公布号 US2016093482(A1) 申请公布日期 2016.03.31
申请号 US201514964417 申请日期 2015.12.09
申请人 DH Technologies Development Pte. Ltd. 发明人 Campbell John Lawrence;Tate Stephen A.
分类号 H01J49/00 主分类号 H01J49/00
代理机构 代理人
主权项 1. A system for analyzing a sample using variable detection scan resolutions, comprising: a tandem mass spectrometer that includes a mass analyzer that allows variable detection scan resolutions; and a processor in communication with the tandem mass spectrometer that divides a mass range of a sample into a collection of precursor ion windows, instructs the tandem mass spectrometer to select and fragment all precursor ions in each precursor ion window of the collection of precursor ions windows, instructs the tandem mass spectrometer to analyze fragment ions of each precursor ion window of the collection of precursor ions windows using a detection scan and, based on information about the distribution of precursor ions across the mass range, to use at least two different detection scan resolutions to analyze fragment ions of at least two different precursor ion windows of the collection of precursor ion windows, which maintains the selectivity of fragment ion analysis while increasing the speed of the fragment ion analysis across the mass range.
地址 Singapore SG