发明名称 ANTI REFLECTION FILM, DISPLAY DEVICE, METHOD FOR SELECTING ANTI REFLECTION FILM FOR DISPLAY DEVICE
摘要 To provide an antireflection film that is, in the case where a super high definition display element is used, capable of suppressing reflection on the surface of the display device, and capable of suppressing whitening, while preventing the image quality of the super high definition display element from being impaired.;An antireflection film containing a transparent substrate, having thereon a high refractive index layer and a low refractive index layer, in which the antireflection film has a diffusion light reflectance (RSCE) measured under the following condition of 0.12% or less and is for a display element having a total light reflectance (RSCI) of 4.0% or more,;Measurement of Diffusion Light Reflectance:;A black plate is adhered with a transparent adhesive to a surface of the transparent substrate of the antireflection film that is opposite to the side of the high refractive index layer to prepare a specimen, and a surface of the specimen on the side of the low refractive index layer is measured for a diffusion light reflectance (RSCE).
申请公布号 US2016091632(A1) 申请公布日期 2016.03.31
申请号 US201514864228 申请日期 2015.09.24
申请人 DAI NIPPON PRINTING CO., LTD. 发明人 SHIMATSU Tomohiko;SHINOHARA Seiji;NAKAMURA Hiroshi
分类号 G02B1/11 主分类号 G02B1/11
代理机构 代理人
主权项 1. An antireflection film comprising a transparent substrate, having thereon a high refractive index layer and a low refractive index layer, the antireflection film having a diffusion light reflectance (RSCE) measured under the following condition of 0.12% or less, and the antireflection film being for a display element having a total light reflectance (RSCI) of 4.0% or more, measurement of the diffusion light reflectance: a black plate is adhered with a transparent adhesive to a surface of the transparent substrate of the antireflection film that is opposite to the side of the high refractive index layer to prepare a specimen, and a surface of the specimen on the side of the low refractive index layer is measured for a diffusion light reflectance (RSCE).
地址 Tokyo JP