发明名称 ULTRAVIOLET ABSORBER, COMPOSITION FOR FORMING RESIST UNDER LAYER FILM, AND PATTERNING PROCESS
摘要 PROBLEM TO BE SOLVED: To provide an ultraviolet absorber, which is added to a composition for forming a resist under layer film so that reflection can be suppressed particularly in a lithography process by an ultraviolet laser and a pattern profile can be improved without influencing dry etching mask properties or adhesiveness to a resist pattern, compared with a case using a conventional silicon-containing resist under layer film.SOLUTION: The ultraviolet absorber contains a compound represented by the general formula (A-1) in the figure, (In the formula, R represents a methyl group, an ethyl group, a propyl group, or an allyl group; and R, R, R, and Rmay be identical or different, and each represent a hydrogen atom, a benzoyl group, a toluoyl group, a naphthoyl group, or an anthranoyl group.)SELECTED DRAWING: None
申请公布号 JP2016041791(A) 申请公布日期 2016.03.31
申请号 JP20140166441 申请日期 2014.08.19
申请人 SHIN ETSU CHEM CO LTD 发明人 OGIWARA TSUTOMU;KOORI DAISUKE
分类号 C09K3/00;G03F7/11;H01L21/027 主分类号 C09K3/00
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