发明名称 METHOD AND APPARATUS FOR THERMAL PROCESSING QUALITY DETERMINATION IN THERMAL PROCESSOR
摘要 PROBLEM TO BE SOLVED: To enable a failure occurrence of thermal processing to easily be detected even when a fluctuation in applied pressure occurs on a workpiece of a heater chip upon a heating start by a fluctuation in the fall speed of an elevation head without using an expensive and complicate height measurement part such as a rotary encoder.SOLUTION: A method is adopted to a thermal processor which makes an elevation/lowering head 28 capable of elevating/lowering and fixing a position with respect to a base 22 hold a downwardly spring-energized heater chip 32 to be capable of moving up and down, presses the heater chip 32 against a work piece 48, and generates heat to thermally process the work piece 48 by making an elevation/lowering head 28 lower from a reference position. The elevation/lowering head 28 is controlled to elevate/lower by a motor 28 and stops the drive of the motor 28 when a pressing force of a spring 36 on the work piece 48 reaches a set pressure, makes the heater chip 32 generate heat, and determines quality of thermal processing by a lowering amount of the heater chip 32 accompanying the thermal processing of the work piece 48.SELECTED DRAWING: Figure 4
申请公布号 JP2016041443(A) 申请公布日期 2016.03.31
申请号 JP20140166554 申请日期 2014.08.19
申请人 NIPPON AVIONICS CO LTD 发明人 HIROSE TAKAYUKI;MIYATA TAKASHI;TAKEZAWA TADAO
分类号 B23K3/04;B23K1/00;B23K11/24;B29C65/02;B29C65/78 主分类号 B23K3/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利