发明名称 |
IMAGING DEVICE |
摘要 |
An imaging device which offers an image with high quality and is suitable for high-speed operation is provided. The imaging device includes a first region to an n-th region (n is a natural number of 2 or more and 16 or less) each including a first circuit, a second circuit, a third circuit, and a fourth circuit. The first to third circuits each include a transistor in which silicon is used in an active layer or an active region. The fourth circuit includes a photoelectric conversion element and a transistor in which an oxide semiconductor is used in an active layer. The first circuit includes a region overlapping with the fourth circuit. The third circuit includes a region overlapping with the fourth circuit. |
申请公布号 |
US2016093652(A1) |
申请公布日期 |
2016.03.31 |
申请号 |
US201514859530 |
申请日期 |
2015.09.21 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
IKEDA Takayuki;KUROKAWA Yoshiyuki |
分类号 |
H01L27/146;H01L31/032;H01L31/0272;H01L29/786;H01L29/24 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. An imaging device comprising:
a first region to an n-th region (n is a natural number of 2 or more and 16 or less); and a first circuit, a second circuit, a third circuit, and a fourth circuit in each of the first region to the n-th region, wherein the first to third circuits each include a transistor in which silicon is used in an active layer or an active region, wherein the fourth circuit includes a transistor in which an oxide semiconductor is used in an active layer and a photoelectric conversion element, wherein the first circuit is configured to read out a signal from the third circuit, wherein the second circuit is configured to output a signal for driving the fourth circuit, wherein the third circuit is configured to process a signal output from the fourth circuit, wherein the fourth circuit is configured to convert light into the signal, wherein the first circuit includes a region overlapping with the fourth circuit, and wherein the third circuit includes a region overlapping with the fourth circuit. |
地址 |
Atsugi-shi JP |