| 发明名称 |
APPARATUS FOR TESTING ANALOG-TO-DIGITAL CONVERTER AND TESTING METHOD THEREOF |
| 摘要 |
There is provided an apparatus for testing an analog-to-digital converter including: an analog-to-digital converter converting an analog type signal into a digital type signal; a signal generator applying a predetermined type analog signal to the analog-to-digital converter; a first processor controlling the signal generator so that the analog signal is divided to be applied to the analog-to-digital converter; and a second processor determining error occurrence, determining a valid range, and calculating DNL and INL of output data of the analog-to-digital converter. |
| 申请公布号 |
US2016094238(A1) |
申请公布日期 |
2016.03.31 |
| 申请号 |
US201514858634 |
申请日期 |
2015.09.18 |
| 申请人 |
Samsung Electro-Mechanics Co., Ltd. |
发明人 |
KANG Jin Yong |
| 分类号 |
H03M1/10 |
主分类号 |
H03M1/10 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An apparatus for testing an analog-to-digital converter, the apparatus comprising:
an analog-to-digital converter converting an analog type signal into a digital type signal; a signal generator applying a predetermined type analog signal to the analog-to-digital converter; and a first processor controlling the signal generator so that the analog signal is divided to have at least two measurement intervals. |
| 地址 |
Suwon-Si KR |
