发明名称 FLATNESS CONTROL DEVICE
摘要 This flatness control device is characterized by being provided with: a shape meter that measures flatness; a flatness target value setting device that sets a target value of flatness; an operation amount calculation device that calculates the operation amount of each of actuators; a monitoring device that monitors whether the amount of change of an actual value of flatness exceeds a predetermined flatness threshold value; a storage device that, when the amount of change of the actual value of flatness exceeds the flatness threshold value, associates and stores the amount of change of the actual value of flatness and the actual value of the operation amount of each of the actuators; a flatness influence coefficient calculation device that calculates an identified value; a flatness influence coefficient learned value calculation device that, on the basis of an identified value of this time and a learned value of the last time, calculates a learned value of this time, and sets the learned value of this time for the operation amount calculation device; and a flatness influence coefficient learned value saving device that stores a leaned value of each of influence coefficients.
申请公布号 WO2016046945(A1) 申请公布日期 2016.03.31
申请号 WO2014JP75488 申请日期 2014.09.25
申请人 TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION 发明人 NII, TOSHIHIRO;KUBO, NAOHIRO
分类号 B21B38/02;G05B13/02 主分类号 B21B38/02
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