发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SUBSTRATE PROCESSING APPARATUS, AND RECORDING MEDIUM |
摘要 |
[Problem] To provide a semiconductor device manufacturing method and a substrate processing apparatus, whereby film thickness within a surface of one substrate, and film thicknesses of a plurality of substrates are made uniform. [Solution] The present invention has: a step for placing a plurality of substrates on a substrate placing table in a treatment chamber; a step for rotating the substrate placing table, and supplying first and second treatment regions in the treatment chamber with a first element containing gas and a second element containing gas, respectively; a step for starting plasma excitation of the second element containing gas; and a step for forming, in the first treatment region, a first element containing layer on each of the substrates, and modifying, in the second treatment region, the first element containing layer into active species or the like containing a second element. In the step for starting the plasma excitation, the plasma excitation is started at timing when the substrates and a supply port of the active species or the like are in a predetermined positional relationship. |
申请公布号 |
WO2016046976(A1) |
申请公布日期 |
2016.03.31 |
申请号 |
WO2014JP75701 |
申请日期 |
2014.09.26 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
UEDA, TATSUSHI;OHASHI, NAOFUMI;ITATANI, HIDEHARU;YAMAMOTO, KATSUHIKO;TANABE, JUNICHI;TAIRA, YUKI |
分类号 |
H01L21/31;C23C16/44 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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