发明名称 SECURE LOW VOLTAGE TESTING
摘要 An integrated circuit includes a normal voltage detector configured to detect a normal voltage at which the integrated circuit being fully functional. A first voltage detector detects a first voltage that is less than the normal voltage. A second voltage detector detects a second voltage that is less than the first voltage. A reset module is coupled to a supply voltage, the normal voltage detector, the first voltage detector, and the second voltage detector. The reset module includes test logic to, when the supply voltage rises to the first voltage from the second voltage, perform a pass/fail test when the integrated circuit is in a pass/fail test mode, and perform a power up reset when the integrated circuit in not in the pass/fail test mode.
申请公布号 US2016091561(A1) 申请公布日期 2016.03.31
申请号 US201414502406 申请日期 2014.09.30
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 KNIGHT JOEL R.;EIFERT JAMES B.;PIETRI STEFANO;WATKINS STEVEN K.
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项 1. An integrated circuit, comprising: a normal voltage detector configured to detect a normal voltage, the integrated circuit being fully functional at the normal voltage; a first voltage detector configured to detect a first voltage, the first voltage is less than the normal voltage; a second voltage detector configured to detect a second voltage, the second voltage is less than the first voltage; a reset module coupled to a supply voltage, the normal voltage detector, the first voltage detector, and the second voltage detector, the reset module including test logic operable to: when the supply voltage rises to the first voltage from the second voltage, determine the integrated circuit is in a pass/fail test mode when a first security test is passed;when the integrated circuit is in the pass/fail test mode, perform a pass/fail test; andwhen the integrated circuit in not in the pass/fail test mode, perform a power up reset.
地址 AUSTIN TX US