发明名称 半導体装置
摘要 PROBLEM TO BE SOLVED: To provide a SGT having a structure for forming a transistor as a result of a difference in work functions of a metal and a semiconductor.SOLUTION: A semiconductor device comprises: a columnar semiconductor having an impurity concentration of 10cmor less; a first insulator surrounding the columnar semiconductor; a first metal surrounding the first insulator at one edge of the columnar semiconductor; a second metal surrounding the first insulator at the other edge of the columnar semiconductor; a third metal in which a region between the first metal and the second metal surrounds the first insulator; a second insulator formed between the first metal and the third metal; a third insulator formed between the second metal and the third metal; a fourth metal connecting the first metal and one edge of the columnar semiconductor; and a fifth metal connecting the second metal and the other edge of the columnar semiconductor. The work function of the third metal is 4.2 eV to 5.0 eV.
申请公布号 JP5897676(B2) 申请公布日期 2016.03.30
申请号 JP20140192273 申请日期 2014.09.22
申请人 ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. 发明人 舛岡 富士雄;中村 広記
分类号 H01L21/336;H01L21/28;H01L29/423;H01L29/49;H01L29/78;H01L29/786 主分类号 H01L21/336
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