发明名称 |
半導体装置 |
摘要 |
PROBLEM TO BE SOLVED: To provide a SGT having a structure for forming a transistor as a result of a difference in work functions of a metal and a semiconductor.SOLUTION: A semiconductor device comprises: a columnar semiconductor having an impurity concentration of 10cmor less; a first insulator surrounding the columnar semiconductor; a first metal surrounding the first insulator at one edge of the columnar semiconductor; a second metal surrounding the first insulator at the other edge of the columnar semiconductor; a third metal in which a region between the first metal and the second metal surrounds the first insulator; a second insulator formed between the first metal and the third metal; a third insulator formed between the second metal and the third metal; a fourth metal connecting the first metal and one edge of the columnar semiconductor; and a fifth metal connecting the second metal and the other edge of the columnar semiconductor. The work function of the third metal is 4.2 eV to 5.0 eV. |
申请公布号 |
JP5897676(B2) |
申请公布日期 |
2016.03.30 |
申请号 |
JP20140192273 |
申请日期 |
2014.09.22 |
申请人 |
ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. |
发明人 |
舛岡 富士雄;中村 広記 |
分类号 |
H01L21/336;H01L21/28;H01L29/423;H01L29/49;H01L29/78;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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