| 摘要 |
A system and method utilize a stand-alone controller for a multiplexed handler test cell in automated and robotic semiconductor test equipment for indexless tandem semiconductor testing. The stand-alone controller is configured such that functions relating to both the handler drivers and the data post-processor of the multiplexed handler tested cell are included within the stand-alone controller. The system and method also include provisions for using a virtual multiplexed handler test cell in a preliminary stage prior to actual implementation of the actual multiplexed handler test cell. This configuration permits the stand-alone controller to control the functions of the multiplexed handlers and to coordinate their activity with the tester. |
