发明名称 SCANNING PROBE MICROSCOPE
摘要 A probe microscope head 10 of a scanning probe microscope includes a scanning mechanism 11 to scan a cantilever chip 1 along the X-, Y-, and Z-axes perpendicular to each other, and an optical transmission plate 20 arranged in contact with liquid. The optical transmission plate 20, which transmits detection light for detecting the displacement of the cantilever of the cantilever chip 1, is not scanned by the scanning mechanism 11.
申请公布号 EP2876450(A4) 申请公布日期 2016.03.30
申请号 EP20130822796 申请日期 2013.07.12
申请人 OLYMPUS CORPORATION 发明人 SAKAI, NOBUAKI;UEKUSA, YOSHITSUGU
分类号 G01Q30/14 主分类号 G01Q30/14
代理机构 代理人
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