Method of observing samples with a fluorescent microscope

摘要

The invention relates to a method of inspecting parts of a sample on a TEM grid (12) with a fluorescence microscope, as arises when performing correlative microscopy, more specifically for samples on a holey carbon grid or . A problem occurs when imaging vitrified ice (20) with sample material (22) therein as the ice is heated by the light used. The invention is based on the insight that especially the absorption in the carbon (16) is responsible for the heating, as ice hardly absorbs light. By localizing the illumination of the fluorescent microscope to the parts of the sample that are above a hole (18) in the carbon, heating of the ice is lowered. The localization can be achieved by e.g. passing the light though a LCD type Spatial Light Modulator.