发明名称 研磨装置に使用される研磨パッドの研磨面を監視する方法および装置
摘要 A method is capable of monitoring the polishing surface of the polishing pad without removing the polishing pad from the polishing table. The method includes: conditioning the polishing surface of the polishing pad by causing a rotating dresser to oscillate on the polishing surface; measuring a height of the polishing surface when the conditioning of the polishing surface is performed; calculating a position of a measuring point of the height on a two-dimensional surface defined on the polishing surface; and repeating the measuring of the height of the polishing surface and the calculating of the position of the measuring point to create height distribution in the polishing surface.
申请公布号 JP5896625(B2) 申请公布日期 2016.03.30
申请号 JP20110124057 申请日期 2011.06.02
申请人 株式会社荏原製作所 发明人 篠崎 弘行;島野 隆寛;今村 聴;中村 顕
分类号 B24B53/00;B24B37/00 主分类号 B24B53/00
代理机构 代理人
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