发明名称 Time-variant temperature-based 2-D and 3-D wire routing
摘要 Various features pertain to circuit design schemes that route wires based on temperature. In one aspect, time-variant temperature conditions along a prospective route are taken into account when determining whether to use the route for a wire. For example, a route can be selected from among a set of prospective two-dimensional (2-D) or three-dimensional (3-D) routes based on which route is associated with the “smoothest” temperature gradient. Other aspects of the disclosure pertain to determining or exploiting adjustable search windows, layer wiring densities, worst-case skew values and resistance-capacitance (RC) coupling characteristics, particularly for use with 3-D routing within the layers of a stacked multi-layer substrate.
申请公布号 US9298874(B2) 申请公布日期 2016.03.29
申请号 US201414340411 申请日期 2014.07.24
申请人 QUALCOMM Incorporated 发明人 Liu Chun-Chen;Xie Shengqiong
分类号 G06F17/50 主分类号 G06F17/50
代理机构 Loza & Loza LLP 代理人 Loza & Loza LLP
主权项 1. A routing apparatus, comprising: a memory device; and a processing circuit coupled to the memory device and configured to: identify a plurality of prospective routes for routing a wire through at least one substrate;determine, for each of the prospective routes, a time-variant temperature characteristic associated with the prospective route;select one of the prospective routes based on a skew determined for each of the prospective routes using the time-variant temperature characteristic associated with the each of the prospective routes;store an indication of the selected route in the memory device; andprovide design data including the indication of the selected route that may be used to manufacture an integrated circuit, substrate or printed circuit board.
地址 San Diego CA US
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