发明名称 |
Time-variant temperature-based 2-D and 3-D wire routing |
摘要 |
Various features pertain to circuit design schemes that route wires based on temperature. In one aspect, time-variant temperature conditions along a prospective route are taken into account when determining whether to use the route for a wire. For example, a route can be selected from among a set of prospective two-dimensional (2-D) or three-dimensional (3-D) routes based on which route is associated with the “smoothest” temperature gradient. Other aspects of the disclosure pertain to determining or exploiting adjustable search windows, layer wiring densities, worst-case skew values and resistance-capacitance (RC) coupling characteristics, particularly for use with 3-D routing within the layers of a stacked multi-layer substrate. |
申请公布号 |
US9298874(B2) |
申请公布日期 |
2016.03.29 |
申请号 |
US201414340411 |
申请日期 |
2014.07.24 |
申请人 |
QUALCOMM Incorporated |
发明人 |
Liu Chun-Chen;Xie Shengqiong |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
Loza & Loza LLP |
代理人 |
Loza & Loza LLP |
主权项 |
1. A routing apparatus, comprising:
a memory device; and a processing circuit coupled to the memory device and configured to:
identify a plurality of prospective routes for routing a wire through at least one substrate;determine, for each of the prospective routes, a time-variant temperature characteristic associated with the prospective route;select one of the prospective routes based on a skew determined for each of the prospective routes using the time-variant temperature characteristic associated with the each of the prospective routes;store an indication of the selected route in the memory device; andprovide design data including the indication of the selected route that may be used to manufacture an integrated circuit, substrate or printed circuit board. |
地址 |
San Diego CA US |