发明名称 |
Methods for depositing group III-V layers on substrates |
摘要 |
Methods for depositing a group III-V layer on a substrate are disclosed herein. In some embodiments a method includes depositing a first layer comprising at least one of a first Group III element or a first Group V element on a silicon-containing surface oriented in a <111> direction at a first temperature ranging from about 300 to about 400 degrees Celsius; and depositing a second layer comprising second Group III element and a second Group V element atop the first layer at a second temperature ranging from about 300 to about 600 degrees Celsius. |
申请公布号 |
US9299560(B2) |
申请公布日期 |
2016.03.29 |
申请号 |
US201313736504 |
申请日期 |
2013.01.08 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
Sanchez Errol Antonio C.;Huang Yi-Chiau;Bao Xinyu |
分类号 |
H01L21/02;H01L21/285;H01L21/3065 |
主分类号 |
H01L21/02 |
代理机构 |
Moser Taboada |
代理人 |
Moser Taboada ;Taboada Alan |
主权项 |
1. A method of depositing a group III-V layer on a substrate, comprising:
etching a silicon-containing substrate, having a surface oriented in a direction other than a <111> direction, to etch out a source/drain region in the silicon-containing substrate; growing a silicon-containing surface oriented in the <111> direction in the etched out source/drain region atop a surface oriented in a direction other than the <111> direction; depositing a first layer comprising at least one of a first Group III element or a first Group V element on the silicon-containing surface oriented in the <111> direction at a first temperature ranging from about 300 to about 400 degrees Celsius; and depositing a second layer comprising a second Group III element and a second Group V element atop the first layer at a second temperature ranging from about 300 to about 600 degrees Celsius. |
地址 |
Santa Clara CA US |