发明名称 Methods for depositing group III-V layers on substrates
摘要 Methods for depositing a group III-V layer on a substrate are disclosed herein. In some embodiments a method includes depositing a first layer comprising at least one of a first Group III element or a first Group V element on a silicon-containing surface oriented in a <111> direction at a first temperature ranging from about 300 to about 400 degrees Celsius; and depositing a second layer comprising second Group III element and a second Group V element atop the first layer at a second temperature ranging from about 300 to about 600 degrees Celsius.
申请公布号 US9299560(B2) 申请公布日期 2016.03.29
申请号 US201313736504 申请日期 2013.01.08
申请人 APPLIED MATERIALS, INC. 发明人 Sanchez Errol Antonio C.;Huang Yi-Chiau;Bao Xinyu
分类号 H01L21/02;H01L21/285;H01L21/3065 主分类号 H01L21/02
代理机构 Moser Taboada 代理人 Moser Taboada ;Taboada Alan
主权项 1. A method of depositing a group III-V layer on a substrate, comprising: etching a silicon-containing substrate, having a surface oriented in a direction other than a <111> direction, to etch out a source/drain region in the silicon-containing substrate; growing a silicon-containing surface oriented in the <111> direction in the etched out source/drain region atop a surface oriented in a direction other than the <111> direction; depositing a first layer comprising at least one of a first Group III element or a first Group V element on the silicon-containing surface oriented in the <111> direction at a first temperature ranging from about 300 to about 400 degrees Celsius; and depositing a second layer comprising a second Group III element and a second Group V element atop the first layer at a second temperature ranging from about 300 to about 600 degrees Celsius.
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