发明名称 Multi charged particle beam writing apparatus
摘要 A multi charged particle beam writing apparatus includes an aperture member to form multiple beams, a blanking plate in which there are arranged a plurality of blankers to respectively perform blanking deflection for a corresponding beam in the multiple beams having passed through a plurality of openings of the aperture member, a blanking aperture member to block each beam having been deflected to be in OFF state by at least one of the plurality of blankers, a first grating lens, using the aperture member as gratings, to correct spherical aberration of the charged particle beam, and a correction lens configured to correct high order spherical aberration produced by the first grating lens.
申请公布号 US9299535(B2) 申请公布日期 2016.03.29
申请号 US201514638786 申请日期 2015.03.04
申请人 NuFlare Technology, Inc. 发明人 Ogasawara Munehiro
分类号 H01J37/30;H01J37/141;H01J37/153;H01J37/317;H01J37/04 主分类号 H01J37/30
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A multi charged particle beam writing apparatus comprising: a stage configured to mount a target object thereon and to be continuously movable; an emission unit configured to emit a charged particle beam; an aperture member, in which a plurality of openings are formed, configured to form multiple beams by letting a region including a whole of the plurality of openings be irradiated with the charged particle beam and letting portions of the charged particle beam respectively pass through a corresponding opening of the plurality of openings; a blanking plate in which there are arranged a plurality of blankers configured to respectively perform blanking deflection for a corresponding beam in the multiple beams having passed through the plurality of openings of the aperture member; a blanking aperture member configured to block each beam having been deflected to be in OFF state by at least one of the plurality of blankers; a first grating lens, using the aperture member as gratings, configured to correct spherical aberration of the charged particle beam; and a correction lens configured to correct high order spherical aberration produced by the first grating lens.
地址 Yokohama JP