发明名称 Automatic analyzer
摘要 An automatic analyzer includes a storage unit for storing operation information information about usage histories of expendable supplies provided for the analysis, and an analysis-ID control unit giving an ID to the analysis, the analysis ID being used as information for identifying the analysis to derive a calibration curve. Data stored in the storage unit is organized along the same time axis both in the order of samples subjected to the analysis and inspection, and in the order of analysis items, so that the data is output in a total data display area. The data is organized from the viewpoint of an analysis process of an analysis item of each sample. By use of information used to identify an influence range based on a kind of an abnormal state, which is stored beforehand, a judgment is made as to whether or not it is necessary to perform reinspection.
申请公布号 US9297820(B2) 申请公布日期 2016.03.29
申请号 US200912369187 申请日期 2009.02.11
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 Iizumi Noriko;Tomiyama Tomoko;Takagi Yoshimitsu;Imai Kyoko;Kodama Ryuichiro;Mimura Tomonori
分类号 G01N35/00 主分类号 G01N35/00
代理机构 Mattingly & Malur, PC 代理人 Mattingly & Malur, PC
主权项 1. An automatic analyzer comprising: an analysis equipment device having sample pipetting means for pipetting samples into reaction containers, reagent pipetting means for pipetting reagents into said reaction containers, and measurement means for analyzing and inspecting components in said samples; a controller connected to said analysis equipment device, said sample pipetting means, said reagent pipetting means, and said measurement means; a storage unit connected to the controller which is programmed to store in the storage unit: information of operation conditions of the analysis equipment device while analyzing and inspecting said samples,information concerning expendables used in analyzing and inspecting said samples,information of analysis and inspection executed to determine one or more calibration curves used for calibrating the analysis and inspection of said samples, andanalysis process data of predetermined analysis processes including time information for each of the samples on an analysis item basis; and a display section, connected to the controller, for displaying the analysis process data, wherein the controller is programmed to: control said analysis equipment device according to the predetermined analysis processes required to analyze said samples, control said sample pipetting means to pipette samples into reaction containers, control reagent pipetting means to pipette reagents into said reaction containers, control said measurement means to analyze and inspect components in said samples, associate the analysis process data from more than one samples and analysis items based on the time information of each sample from the analysis process data stored in the storage unit, display a time-series arrangement of the analysis process data for more than one of the samples in columns, wherein each column represents a period of time of the predetermined analysis processes required to analyze said samples, and analysis items arranged in rows in the order analyzed by the analysis equipment device in relation to the information of operation conditions of the analysis equipment device while analyzing and inspecting said samples, identify the information concerning expendables used in analyzing and inspecting a particular sample from the information concerning expendables used in analyzing and inspecting said samples stored in the storage unit and identify the information of analysis and inspection executed to determine one or more calibration curves used for calibrating the analysis and inspection of the particular sample from the information of analysis and inspection executed to determine one or more calibration curves used for calibrating the analysis and inspection of said samples stored in the storage unit, display the information concerning expendables used in analyzing and inspecting the particular sample, and the information of analysis and inspection executed to determine one of said calibration curves used for calibrating the analysis and inspection of said particular sample simultaneously on a same display screen in relation to the information of operation conditions of the analysis equipment device while analyzing and inspecting said samples, and detect an abnormal state relating to at least one of the predetermined analysis processes and results thereof, wherein upon detecting an abnormal state by the controller, the controller displays an alarm as a column in the time-series arrangement of the analysis process data immediately after the column representing the time period when the abnormal state relating to the at least one of the predetermined analysis processes and results thereof occurred, wherein said controller is programmed to identify an influence range within which certain ones of the predetermined analysis processes are affected by the alarm, based on causes of said alarm regarding said abnormal state, and wherein said controller is programmed to judge whether it is necessary to perform reinspection for the certain ones of the predetermined analysis processes within the influence range, and automatically performs the required reinspection based on the causes of said alarm for the certain ones of the predetermined analysis processes that are judged to require reinspection.
地址 Tokyo JP