发明名称 Stacked semiconductor structure and manufacturing method for the same
摘要 A stacked semiconductor structure and a manufacturing method for the same are provided. The stacked semiconductor structure is provided, which comprises a first semiconductor substrate, a second semiconductor substrate, a dielectric layer, a trench, a via, and a conductive structure. The first semiconductor substrate comprises a first substrate portion and a first conductive layer on an active surface of the first substrate portion. The second semiconductor substrate comprises a second substrate portion and a second conductive layer on an active surface of the second substrate portion. The trench passes through the second substrate portion and exposing the second conductive layer. The via passes through the dielectric layer and exposes the first conductive layer. The conductive structure has an upper portion filling the trench and a lower portion filling the via. Opposing side surfaces of the upper portion are beyond opposing side surfaces of the lower portion.
申请公布号 US9299624(B2) 申请公布日期 2016.03.29
申请号 US201414159657 申请日期 2014.01.21
申请人 UNITED MICROELECTRONICS CORP. 发明人 Hou Hsin-Ming;Kung Ji-Fu
分类号 H01L21/66;H01L25/07;H01L25/00;H01L23/538 主分类号 H01L21/66
代理机构 WPAT, PC 代理人 WPAT, PC ;King Justin
主权项 1. A stacked semiconductor structure, comprising: a first stacked structure comprising a first substrate portion, a first dielectric structure formed on an active surface of the first substrate portion, and a first conductive layer formed on or in the first dielectric structure; a second stacked structure comprising a second substrate portion, a second dielectric structure formed under and directly in contact with an active surface of the second substrate portion, and a second conductive layer formed under or in the second dielectric structure; a dielectric layer between the first conductive layer and the second conductive layer; a trench passing through the second substrate portion and exposing the second conductive layer; a via passing through the dielectric layer and exposing the first conductive layer, the via being under the trench and communicated with the trench; and a conductive structure having an upper portion filling the trench and a lower portion filling the via, opposing side surfaces of the upper portion being beyond opposing side surfaces of the lower portion, wherein the conductive structure has an anti-fuse portion.
地址 Hsinchu TW