发明名称 Flowable oxide film with tunable wet etch rate
摘要 Provided herein are integration-compatible dielectric films and methods of depositing and modifying them. According to various embodiments, the methods can include deposition of flowable dielectric films targeting specific film properties and/or modification of those properties with an integration-compatible treatment process. In certain embodiments, methods of depositing and modifying flowable dielectric films having tunable wet etch rates and other properties are provided. Wet etch rates can be tuned during integration through am integration-compatible treatment process. Examples of treatment processes include plasma exposure and ultraviolet radiation exposure.
申请公布号 US9299559(B2) 申请公布日期 2016.03.29
申请号 US201414466222 申请日期 2014.08.22
申请人 Novellus Systems, Inc. 发明人 Draeger Nerissa;Shannon Karena;van Schravendijk Bart;Ashtiani Kaihan
分类号 H01L21/302;H01L21/02;H01L21/311 主分类号 H01L21/302
代理机构 Weaver Austin Villeneuve & Sampson LLP 代理人 Weaver Austin Villeneuve & Sampson LLP
主权项 1. A method comprising: after performing one or more integration operations including at least one of a lithography process, an ion implantation process, a photoresist strip process, a wet etch clean, and a dry etch process on a substrate including a flowable dielectric film, treating the flowable dielectric film to modify a wet etch rate of the flowable dielectric film, wherein the one or more integration operations are performed on a film other than the flowable dielectric film.
地址 Fremont CA US