发明名称 Nanoparticulate assisted nanoscale molecular imaging by mass spectrometery
摘要 Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
申请公布号 US9297761(B2) 申请公布日期 2016.03.29
申请号 US201314092732 申请日期 2013.11.27
申请人 IONWERKS, INC. 发明人 Schultz J. Albert;Egan Thomas F.;Lewis Ernest K.;Ulrich Steven;Waters Kelley L.
分类号 H01J49/40;G01N21/64;H01J49/04;H01J49/00;H01J49/14;H01J49/26 主分类号 H01J49/40
代理机构 Norton Rose Fulbright US LLP 代理人 Norton Rose Fulbright US LLP
主权项 1. An analytical instrument for the characterization and analysis of a sample comprising: a sample stage for positioning a sample; a nanoparticulate beam source positioned to deliver a nanoparticulate beam to a sample on said sample stage to deposit a matrix in the sample; wherein the nanoparticulate beam source comprises a nanoparticulate silver beam source or a nanoparticulate silver ion beam source; a nanofocused primary particle beam source, said nanofocused beam source positioned to deliver a beam to said sample including the matrix; and, an analyzer positioned to analyze material or photons emitted from said sample; wherein said nanofocused primary particle beam source comprises a nanofocused neon ion particle beam source.
地址 Houston TX US