发明名称 |
Nanoparticulate assisted nanoscale molecular imaging by mass spectrometery |
摘要 |
Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source. |
申请公布号 |
US9297761(B2) |
申请公布日期 |
2016.03.29 |
申请号 |
US201314092732 |
申请日期 |
2013.11.27 |
申请人 |
IONWERKS, INC. |
发明人 |
Schultz J. Albert;Egan Thomas F.;Lewis Ernest K.;Ulrich Steven;Waters Kelley L. |
分类号 |
H01J49/40;G01N21/64;H01J49/04;H01J49/00;H01J49/14;H01J49/26 |
主分类号 |
H01J49/40 |
代理机构 |
Norton Rose Fulbright US LLP |
代理人 |
Norton Rose Fulbright US LLP |
主权项 |
1. An analytical instrument for the characterization and analysis of a sample comprising:
a sample stage for positioning a sample; a nanoparticulate beam source positioned to deliver a nanoparticulate beam to a sample on said sample stage to deposit a matrix in the sample; wherein the nanoparticulate beam source comprises a nanoparticulate silver beam source or a nanoparticulate silver ion beam source; a nanofocused primary particle beam source, said nanofocused beam source positioned to deliver a beam to said sample including the matrix; and, an analyzer positioned to analyze material or photons emitted from said sample; wherein said nanofocused primary particle beam source comprises a nanofocused neon ion particle beam source. |
地址 |
Houston TX US |