发明名称 Optoelectronic devices incorporating single crystalline aluminum nitride substrate
摘要 The invention provides an optoelectronic device adapted to emit ultraviolet light, including an aluminum nitride single crystalline substrate, wherein the dislocation density of the substrate is less than about 105 cm−2 and the Full Width Half Maximum (FWHM) of the double axis rocking curve for the (002) and (102) crystallographic planes is less than about 200 arcsec; and an ultraviolet light-emitting diode structure overlying the aluminum nitride single crystalline substrate, the diode structure including a first electrode electrically connected to an n-type semiconductor layer and a second electrode electrically connected to a p-type semiconductor layer. In certain embodiments, the optoelectronic devices of the invention exhibit a reverse leakage current less than about 10−5 A/cm2 at −10V and/or an L80 of at least about 5000 hours at an injection current density of 28 A/cm2.
申请公布号 US9299883(B2) 申请公布日期 2016.03.29
申请号 US201414165943 申请日期 2014.01.28
申请人 Hexatech, Inc. 发明人 Xie Jinqiao;Moody Baxter;Mita Seiji
分类号 H01L33/02;H01L33/32;H01L21/02;H01L33/00 主分类号 H01L33/02
代理机构 Womble Carlyle Sandridge & Rice LLP 代理人 Womble Carlyle Sandridge & Rice LLP
主权项 1. An optoelectronic device adapted to emit ultraviolet light, comprising: an aluminum nitride single crystalline substrate, wherein the dislocation density of the substrate is less than about 105 cm−2 and the Full Width Half Maximum (FWHM) of the double axis rocking curve for the (002) and (102) crystallographic planes is less than about 200 arcsec; and an ultraviolet light-emitting diode structure overlying the aluminum nitride single crystalline substrate, the diode structure comprising a first electrode electrically connected to an n-type semiconductor layer and a second electrode electrically connected to a p-type semiconductor layer, where the optoelectronic device has an L80 of at least about 5000 hours at an injection current density of 28 A/cm2.
地址 Morrisville NC US