发明名称 Time-domain searching in a test and measurement instrument
摘要 Embodiments of the invention include devices and methods for searching IQ-based time-domain traces for events, marking the events, and analyzing intervals of interest at or around the events on a display unit of a test and measurement instrument. The test and measurement instrument can include an input terminal to receive an RF signal, an ADC to digitize the RF signal, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized RF signal, an acquisition memory to acquire and store a record, a trace generation section to generate one or more IQ-based time-domain traces, and a search unit to scan the IQ-based time-domain traces for one or more events. The search unit can locate and mark the events for display on a display unit of the test and measurement instrument.
申请公布号 US9297834(B2) 申请公布日期 2016.03.29
申请号 US201012856491 申请日期 2010.08.13
申请人 TEKTRONIX, INC. 发明人 Dobyns Kenneth P.;Waldo Gary J.
分类号 H04B3/46;G01R13/02 主分类号 H04B3/46
代理机构 代理人 Lenihan Thomas F.;Johnson Marger
主权项 1. A test and measurement instrument, comprising: an input terminal configured to receive a radio frequency signal under test; an analog-to-digital converter (ADC) configured to digitize the signal under test; a digital downconverter configured to produce I (in-phase) and Q (quadrature) baseband component information from the digitized signal; an acquisition memory configured to store one or more records of the digitized I and Q baseband component information associated with the digitized signal; a trace generation section configured to generate one or more types of IQ-based time-domain data using the I and Q baseband component information stored in the acquisition memory, generate one or more IQ-based time-domain traces based on the IQ-based time-domain data, and generate individual traces of the I and Q baseband component information; and a search unit configured to scan the one or more types of IQ-based time-domain data generated using the I and Q baseband component information stored in the acquisition memory for one or more events and directly scan the individual trace of the I baseband component information or the individual trace of the Q baseband component information for one or more events.
地址 Beaverton OR US
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